Abstract: As manufacturing processes become increasingly complex, maintaining quality and improving efficiency requires mapping of process flows. Mapping process flows, in turn, depends on ...
Abstract: Hafnium-based Ferroelectric Field-Effect Transistors (FeFETs) suffer from limited endurance. In-depth understanding of the trap behaviour during failure process is crucial for endurance ...
Send this article to your social connections.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results